+90 533 762 3815
Your shopping cart is empty!
FY 8000 Sourcemter measures current-voltage (I-V) characteristics of solar cells, Schottky diode, p-n junction, photosensors, biosensor, gas sensors under various external effects..
Solar Simulator system automatically adjust intensity for various illuminations..
FYTRONIX THIN FILM TRANSISTOR CHARACTERIZATION SYSTEM includes This SYSTEM analyzes transfer and output characteristics of thin film transistors , TFT, OFET The system is a complete&nb..
Product Compare (0)
OPEN SYSTEM NITROGEN CRYOSTATTemperature range: RT to 80KCryostat for I-V and C-V measurementsCryostat for electrical measurements..
System measure electrical conductivity of semiconductor, organic semiconductor, superconductor and metals as a function temperature. Temperature range: RT to 450 K Method: Two probe method o..
Systemmeasure AC conductivity and dielectric parameters of powder and thin filmmaterials. System have software for measurements of all dielectric parametersand AC conductivity parameters of powder sam..
This DIP coater coat the quantum dots
and metal oxides and all-in solutions.
coater is a complete solution coating system.
contains the follow..
SEMICONDUCTOR DEVICE CHARACTERIZATION SYSTEM includes
and C-V, G-V Characterization System
This system analyze all electrical
characteristics of photodi..
1. Nanofiber (semiconductor, superconductor, insulator)2. Nano thin film3. Thin film applications4. Thin films for diode, photosensor, solar cells, transistor..
temperature furnace is used for thermal treatment, ageing, sintering
processes of metal oxide semiconductors, Schottky diode, heterojunction diode,
Solar cell, thin films and powder materials...
High Temperature furnace Temperature Range: 25 oC to 1000 oC. Controller PID Time: 0-12 h..