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OPEN SYSTEM NITROGEN CRYOSTAT

0.00TL

OPEN SYSTEM NITROGEN CRYOSTATTemperature range: RT to 80KCryostat for I-V and C-V measurementsCryostat for electrical measurements..

DC ELECTRICAL CONDUCTIVITY

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System measure electrical conductivity of semiconductor, organic semiconductor, superconductor and metals as a function temperature. Temperature range: RT to 450 K Method: Two probe method o..

DIELECTRIC SYSTEM

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Systemmeasure AC conductivity and dielectric parameters of powder and thin filmmaterials. System have software for measurements of all dielectric parametersand AC conductivity parameters of powder sam..

DIP COATER

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This DIP coater coat the quantum dots and metal oxides and all-in solutions.   The DIP coater is a complete solution coating system.     The system contains the follow..

ELECTRONIC DEVICES CHARACTERIZATION SYSTEM

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FYTRONIX SEMICONDUCTOR DEVICE CHARACTERIZATION SYSTEM includes   1.   I-V and C-V, G-V Characterization System This system analyze all electrical characteristics of photodi..

Electrospinning system

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1. Nanofiber (semiconductor, superconductor, insulator)2. Nano thin film3. Thin film applications4. Thin films for diode, photosensor, solar cells, transistor..

Four Probe Resistance System

100,920.75TL

Updating.....

HIGH TEMPERATURE FURNACE

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High temperature furnace is used for thermal treatment, ageing, sintering processes of metal oxide semiconductors, Schottky diode, heterojunction diode, Solar cell, thin films and powder materials...

HIGH PRESSURE REACTOR

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High Temperature furnace Temperature Range: 25 oC to 1000 oC. Controller PID Time: 0-12 h..

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