× HYDROTHERMAL SYSTEM SPIN COATER SC-X20 WAVELENGTH DEPENDENT LED PHOTOCATALYTIC SYSTEM PHOTOSYNTHETICALLY ACTIVE RADIATION SYSTEM HYPERTHERMIA THERAPY SYSTEM PROBE STATION PROBE HOLDER HIGH TEMPERATURE FURNACE CURRENT-VOLTAGE TESTER UNDER VARIOUS TEMPERATURES PHOTODEVICE CHARACTERIZATION SYSTEM TRIBOMETER AAA CLASS LED SOLAR SIMULATOR 9830 EPD COATING SYSTEM PHOTORESPONSE SYSTEM SOLAR PANEL SOLAR SIMULATOR ELECTROSPINNING SYSTEM ESP 9300 AAA CLASS SOLAR SIMULATOR FYTRONIX-9860 XENON LIGHT SOURCE CYCLIC VOLTAMETRY ELECTRODES 9000-HOT PRESS 9000-HOT PRESS 2 PHOTOCONDUCTIVITY – TIME MEASUREMENT SYSTEM LED QUANTUM EFFICIENCY SYSTEM FY-MGSP-3 2 RF + 1 DC MAGNETRON SPUTTERING SYSTEM FYT-T1800 1800C HIGH TEMPERATURE TUBE FURNACE UV CURABLE EPD COATING SYSTEM ULTRASONIC SPRAY COATING SYSTEM ULTRASONIC SONICATOR SPARK PLASMA SYSTEM SOL GEL THIN FILM COATER SILAR QUANTUM DOTS COATER REFERENCE SOLAR CELL CERTIFICATE REFERECE SOLAR CELL QUANTUM EFFICIENCY SYSTEM PHOTORESPONSE AND PHOTOCAPACITANCE ANALYZER PHOTOCHEMICAL SYSTEM PHOTOCATALYSIS SYSTEM PHOTOCATALYSIS SOLAR SIMULATOR OPTICAL CONSTANTS CHARACTERIATION SYSTEM OLED CHARACTERIZATION SYSTEM OFET CHARACTERIZATION SYSTEM FULL AUTOMATIC SOLAR SIMULATOR MICROMETER ADJUSTABLE THIN FILM COATER DOCTOR BLADE MARKSTRONIC AAA CLASS LED SOLAR SIMULATOR MAGNETIC FIELD ASSISTED ELECTROSPINNING IMPEDANCE ANALYZER LCR METER IMPEDANCE ANALYZER HIGH PRESSURE REACTOR SYSTEM HALL EFFECT MEASUREMENT SYSTEM GLOVEBOX SYSTEM GAS SENSOR MEASUREMENT SYSTEM UV DEZENFEKTE CİHAZI SPIN COATER HYDROTHERMAL SYSTEM EPD COATING SYSTEM ELECTROSPINNING SYSTEM 9800 AAA CLASS SOLAR SIMULATOR 9600 AAA CLASS SOLAR SIMULATOR FULL AUTOMATIC SOLAR IV – IMPEDANCE ANALYZER SYSTEM FOUR PROBE CONDUCTIVITY METER FOUR POINT PROBE RESISTANCE SYSTEM ELEKTROSPINNING MACHINE ELECTROSPINNING MACHINE/NANOFIBER ELECTROPHORETIC DEPOSITION (EPD) ELECTRICAL CONDUCTIVITY SYSTEM DYE SENSITIZED SOLAR CELL HOLDER DIP COATER DIELECTRIC MEASUREMENT SYSTEM DIELECTRIC ANALYZER CURRENT AND VOLTAGE MODULATED SYSTEM CONTACT ANGLE TESTER CHEMOTHERAPY OF CANCER 9000 CHEMICAL BATH DEPOSITION CAPACITANCE-VOLTAGE ANALYZER BATTERY CHARGE - DISCHARGE ANALZYER AGATE MORTAR FOR GRINDING AAA CLASS SOLAR SIMULATOR IV CHARATERIZATION SYSTEM 9900 AAA CLASS LED SOLAR SIMULATOR 9800 300 W AAA CLASS SOLAR SIMULATOR 300 W-80 AAA CLASS SOLAR SIMULATOR 300 W-50 AAA CLASS SOLAR SIMULATOR ELEKTROSPINNING NANOFIBER SPIN COATERS - PHOTOLITHOGRAPHY SPIN COATER SOURCE MEASURE UNIT SYSTEM I-V MEASURE SOURCE METER IV AND CV ANALYZER SOLAR SIMULATOR- AAA CLASS SOLAR SIMULATOR SOLAR SIMULATOR AAA CLASS CRYOSTAT ULTRASONIC CLEANING BATH THIN FILM TRANSISTOR CHARACTERIZATION SYSTEM ULTRASONIC SONICATOR 2 HYDROTHERMAL REACTOR/HIGH PRESSURE REACTOR HIGH VOLTAGE POWER SUPPLY HYDROTHERMAL SYSTEM HIGH TEMPERATURE FURNACE FOUR POINT PROBE SCS SEMICONDUCTOR CHARACTERIZATION SYSTEM ELECTRICAL CONDUCTIVITY ANALYZER OPEN SYSTEM NITROGEN CRYOSTAT DC GÜÇ KAYNAĞI 12V/8A THERMAL EVAPORATION AND MAGNETRON SPUTTER SYSTEM WITH OPTIONAL GLOVEBOX INTEGRATION THERMAL ANALYSIS CRUCIBLE CERAMIC ITCH METTLER ALUMINA/TG/DIFFERENTIAL HEAT DSC TGA/DTA
  • Electronic Device  Characterization System

   ELECTRONIC  DEVICE CHARACTERIZATION SYSTEM



FYTRONIX SEMICONDUCTOR DEVICE CHARACTERIZATION SYSTEM includes

1. I-V and C-V, G-V Characterization System
This system analyze all electrical characteristics of photodiode, Schottky diode, heterojunction diode and sensors under dark and illumination conditions 

This system is a complete current-voltage (I-V) , impedance and conductance
Characteristics under dark, light illumination.

The system contains the following elements:
 Automatic Light controlling Solar Simulator
Source meter
Probe Holder and electric connection cables
Software
Voltage range: -20 V to +20 V
Current range: 100 pA  to 0.25 A
C-V and  Dielectric analyzer 
Capacitance range:pF-F
Measurement parameters: 
|Z|, |Y|, θ, Rp, Rs (ESR), G, X, B, Cp, Cs, Lp, Ls, D (tan δ), Q
Frequency range:  50 Hz- 8 MHz
- Electronic device cell probes for all devices 


FYTRONIX FY-9000 SYSTEM AUTOMATICALLY measures the followings

Current-voltage (I-V) of the all electronic devices 
Current-voltage (I-V) under various illuminations from 1 W/m2 to 1000 W/m2
Photocurrent-time (I-t) under various illuminations from 1 W/m2 to 1000 W/m2
Automatically analyze photoconduction mechanism analysis
Automatically analyze photovoltaic mechanism analysis
Automatically calculate all photovoltaic parameters such n (Efficiency), Open voltage circuit (Voc) , short circuit current (Isc), fill factor (FF), series resistance (Rs), shunt resistance (Rsh), solar cell characteristic resistance  (Rchac), Photo Response ratio (RR), maximum power (Pmax), maximum voltage (Vmax), maximum current (Imax)

2. C-V Characterization System
This system analyze all capacitance-voltage-frequency characteristics of solar cells, photodiode, Schottky diode, heterojunction diode and sensors under dark and illumination conditions.

This system is a complete current-voltage (I-V) and  current-time (I-t)  under dark, solar light illumination from 20 mW/cm2 to 100 mW/cm2 (1000 W/m2)

The system contains the following elements:
 Impedance analyzer
Frequency: 100 mHz- 25 Mhz or more
Sourcemeter 
Voltage range: -20 V to +20 V
Current range: 50 pA  to 0.25 A
-  I-V Solar IV  software
- Electronic device cell probes for all devices 


The system measure the following characteristics 
Capacitance-voltage (C-V) under various frequencies
Adjusted Capacitance-voltage (Cadj-V) plots under various frequencies
Adjusted Conductance-voltage (Gadj-V) under under various frequencies
Adjusted Capacitance-voltage (Cadj-V) plots under various temperatures
Adjusted Conductance-voltage (Gadj-V) under various temperatures
Profile of Interface states density-frequency (Nss or Dit-f) 
Profile of Interface states density-frequency (Nss or Dit-f)  under various temperatures
Capacitance-frequency (C-f) at room temperatures
Capacitance-frequency (C-f) under various temperatures

Electronic Device Characterization System

  • Product Code: CHARACTERIZATION_SYSTEM_001
  • Availability: In Stock
  • 0.00TL

1.   I-V and C-V, G-V Characterization System

This system analyze all electrical characteristics of photodiode, Schottky diode, heterojunction diode and sensors under dark and illumination conditions 


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