ELECTRONIC DEVICE CHARACTERIZATION SYSTEM
FYTRONIX SEMICONDUCTOR DEVICE CHARACTERIZATION SYSTEM includes
1. I-V and C-V, G-V Characterization System
This system analyze all electrical characteristics of photodiode, Schottky diode, heterojunction diode and sensors under dark and illumination conditions
This system is a complete current-voltage (I-V) , impedance and conductance
Characteristics under dark, light illumination.
The system contains the following elements:
Automatic Light controlling Solar Simulator
Source meter
Probe Holder and electric connection cables
Software
Voltage range: -20 V to +20 V
Current range: 100 pA to 0.25 A
C-V and Dielectric analyzer
Capacitance range:pF-F
Measurement parameters:
|Z|, |Y|, θ, Rp, Rs (ESR), G, X, B, Cp, Cs, Lp, Ls, D (tan δ), Q
Frequency range: 50 Hz- 8 MHz
- Electronic device cell probes for all devices
FYTRONIX FY-9000 SYSTEM AUTOMATICALLY measures the followings
Current-voltage (I-V) of the all electronic devices
Current-voltage (I-V) under various illuminations from 1 W/m2 to 1000 W/m2
Photocurrent-time (I-t) under various illuminations from 1 W/m2 to 1000 W/m2
Automatically analyze photoconduction mechanism analysis
Automatically analyze photovoltaic mechanism analysis
Automatically calculate all photovoltaic parameters such n (Efficiency), Open voltage circuit (Voc) , short circuit current (Isc), fill factor (FF), series resistance (Rs), shunt resistance (Rsh), solar cell characteristic resistance (Rchac), Photo Response ratio (RR), maximum power (Pmax), maximum voltage (Vmax), maximum current (Imax)
2. C-V Characterization System
This system analyze all capacitance-voltage-frequency characteristics of solar cells, photodiode, Schottky diode, heterojunction diode and sensors under dark and illumination conditions.
This system is a complete current-voltage (I-V) and current-time (I-t) under dark, solar light illumination from 20 mW/cm2 to 100 mW/cm2 (1000 W/m2)
The system contains the following elements:
Impedance analyzer
Frequency: 100 mHz- 25 Mhz or more
Sourcemeter
Voltage range: -20 V to +20 V
Current range: 50 pA to 0.25 A
- I-V Solar IV software
- Electronic device cell probes for all devices
The system measure the following characteristics
Capacitance-voltage (C-V) under various frequencies
Adjusted Capacitance-voltage (Cadj-V) plots under various frequencies
Adjusted Conductance-voltage (Gadj-V) under under various frequencies
Adjusted Capacitance-voltage (Cadj-V) plots under various temperatures
Adjusted Conductance-voltage (Gadj-V) under various temperatures
Profile of Interface states density-frequency (Nss or Dit-f)
Profile of Interface states density-frequency (Nss or Dit-f) under various temperatures
Capacitance-frequency (C-f) at room temperatures
Capacitance-frequency (C-f) under various temperatures
Electronic Device Characterization System
- Product Code: CHARACTERIZATION_SYSTEM_001
- Availability: In Stock
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0.00TL
1.
I-V
and C-V, G-V Characterization System
This system analyze all electrical
characteristics of photodiode, Schottky diode, heterojunction diode and sensors
under dark and illumination conditions
