ELECTRONIC DEVICES CHARACTERIZATION SYSTEM

FYTRONIX SEMICONDUCTOR DEVICE CHARACTERIZATION SYSTEM includes

1.   I-V and C-V, G-V Characterization System

This system analyze all electrical characteristics of photodiode, Schottky diode, heterojunction diode and sensors under dark and illumination conditions

This system is a complete current-voltage (I-V) , impedance and conductance

Characteristics under dark, light illumination.

The system contains the following elements:

 Automatic Light controlling Solar Simulator

Source meter

Probe Holder and electric connection cables

Software

Voltage range: -30 V to +30 V

Current range: 100 pA  to 1 A

C-V and  Dielectric analyzer

Capacitance range:pF-mF

Measurement parameters:

|Z|, |Y|, θ, Rp, Rs (ESR), G, X, B, Cp, Cs, Lp, Ls, D (tan δ), Q

Frequency range:  50 Hz- 8 MHz

- Electronic device cell probes for all devices

- 1 Laptop computer under Windows 7 or more