FYTRONIX THIN FILM TRANSISTOR CHARACTERIZATION SYSTEM includes

 

This SYSTEM analyzes transfer and output characteristics of thin film transistors , TFT, OFET

  

The system is a complete THIN FILM TRANSISTOR CHARACTERIZATION  system.

 

The system contains the following elements:

Sourcemeter

Probe station

Voltage range: -50 V to +50 V or any range

Computer control or manuel

  

FYTRONIX THIN FILM TRANSISTOR CHARACTERIZATION system performs the followings

 

Source-drain IV characteristics under various gate voltages

Gate Voltage-Current characteristics under various drain voltages

Phototransistors Source-drain IV characteristics under various gate voltages