× PHOTOSYNTHETICALLY ACTIVE RADIATION SYSTEM HYPERTHERMIA THERAPY SYSTEM PROBE STATION PROBE HOLDER HIGH TEMPERATURE FURNACE CURRENT-VOLTAGE TESTER UNDER VARIOUS TEMPERATURES PHOTODEVICE CHARACTERIZATION SYSTEM TRIBOMETER AAA CLASS LED SOLAR SIMULATOR 9830 EPD COATING SYSTEM PHOTORESPONSE SYSTEM SOLAR PANEL SOLAR SIMULATOR ELECTROSPINNING SYSTEM ESP 9300 AAA CLASS SOLAR SIMULATOR FYTRONIX-9860 XENON LIGHT SOURCE CYCLIC VOLTAMETRY ELECTRODES 9000-HOT PRESS 9000-HOT PRESS 2 PHOTOCONDUCTIVITY – TIME MEASUREMENT SYSTEM LED QUANTUM EFFICIENCY SYSTEM FY-MGSP-3 2 RF + 1 DC MAGNETRON SPUTTERING SYSTEM FYT-T1800 1800C HIGH TEMPERATURE TUBE FURNACE UV CURABLE EPD COATING SYSTEM ULTRASONIC SPRAY COATING SYSTEM ULTRASONIC SONICATOR SPARK PLASMA SYSTEM SOL GEL THIN FILM COATER SILAR QUANTUM DOTS COATER REFERENCE SOLAR CELL CERTIFICATE REFERECE SOLAR CELL QUANTUM EFFICIENCY SYSTEM PHOTORESPONSE AND PHOTOCAPACITANCE ANALYZER PHOTOCHEMICAL SYSTEM PHOTOCATALYSIS SYSTEM PHOTOCATALYSIS SOLAR SIMULATOR OPTICAL CONSTANTS CHARACTERIATION SYSTEM OLED CHARACTERIZATION SYSTEM OFET CHARACTERIZATION SYSTEM FULL AUTOMATIC SOLAR SIMULATOR MICROMETER ADJUSTABLE THIN FILM COATER DOCTOR BLADE MARKSTRONIC AAA CLASS LED SOLAR SIMULATOR MAGNETIC FIELD ASSISTED ELECTROSPINNING IMPEDANCE ANALYZER LCR METER IMPEDANCE ANALYZER HIGH PRESSURE REACTOR SYSTEM HALL EFFECT MEASUREMENT SYSTEM GLOVEBOX SYSTEM GAS SENSOR MEASUREMENT SYSTEM UV DEZENFEKTE CİHAZI SPIN COATER HYDROTHERMAL SYSTEM EPD COATING SYSTEM ELECTROSPINNING SYSTEM 9800 AAA CLASS SOLAR SIMULATOR 9600 AAA CLASS SOLAR SIMULATOR FULL AUTOMATIC SOLAR IV – IMPEDANCE ANALYZER SYSTEM FOUR PROBE CONDUCTIVITY METER FOUR POINT PROBE RESISTANCE SYSTEM ELEKTROSPINNING MACHINE ELECTROSPINNING MACHINE/NANOFIBER ELECTROPHORETIC DEPOSITION (EPD) ELECTRICAL CONDUCTIVITY SYSTEM DYE SENSITIZED SOLAR CELL HOLDER DIP COATER DIELECTRIC MEASUREMENT SYSTEM DIELECTRIC ANALYZER CURRENT AND VOLTAGE MODULATED SYSTEM CONTACT ANGLE TESTER CHEMOTHERAPY OF CANCER 9000 CHEMICAL BATH DEPOSITION CAPACITANCE-VOLTAGE ANALYZER BATTERY CHARGE - DISCHARGE ANALZYER AGATE MORTAR FOR GRINDING AAA CLASS SOLAR SIMULATOR IV CHARATERIZATION SYSTEM 9900 AAA CLASS LED SOLAR SIMULATOR 9800 300 W AAA CLASS SOLAR SIMULATOR 300 W-80 AAA CLASS SOLAR SIMULATOR 300 W-50 AAA CLASS SOLAR SIMULATOR ELEKTROSPINNING NANOFIBER SPIN COATERS - PHOTOLITHOGRAPHY SPIN COATER SOURCE MEASURE UNIT SYSTEM I-V MEASURE SOURCE METER IV AND CV ANALYZER SOLAR SIMULATOR- AAA CLASS SOLAR SIMULATOR SOLAR SIMULATOR AAA CLASS CRYOSTAT ULTRASONIC CLEANING BATH THIN FILM TRANSISTOR CHARACTERIZATION SYSTEM ULTRASONIC SONICATOR 2 HYDROTHERMAL REACTOR/HIGH PRESSURE REACTOR HIGH VOLTAGE POWER SUPPLY HYDROTHERMAL SYSTEM HIGH TEMPERATURE FURNACE FOUR POINT PROBE SCS SEMICONDUCTOR CHARACTERIZATION SYSTEM ELECTRICAL CONDUCTIVITY ANALYZER OPEN SYSTEM NITROGEN CRYOSTAT DC GÜÇ KAYNAĞI 12V/8A THERMAL EVAPORATION AND MAGNETRON SPUTTER SYSTEM WITH OPTIONAL GLOVEBOX INTEGRATION THERMAL ANALYSIS CRUCIBLE CERAMIC ITCH METTLER ALUMINA/TG/DIFFERENTIAL HEAT DSC TGA/DTA
  • OLED CHARACTERIZATION SYSTEM

   OLED CHARACTERIZATION SYSTEM




FYTRONIX OLED CHARACTERIZATION SYSTEM includes 
 OLED Characterization System 
Spectrometer
Sourcemeter
Sample Holder
Software 
This system analyze all electrical characteristics of organic light emitting diode (OLED). 
This system is a complete system including current-voltage (I-V), Current Efficiency-voltage (J-V), Luminance-Voltage (L-V) of OLEDs and spectroscopic analysis of OLED.. 
 

ELECTRICAL CHARACTERISTICS OF OLED
System measure the followings
Current-voltage (I-V) of OLEDs 
Current efficiency-voltage (Ieff-V) of OLEDS 
Luminance-voltage (L-V) of OLEDS 
Colour x,y coordinate determination of OLEDs
Stability testing of OLED
Lifetime measurements of OLED

ELECTROLUMINANCE CHARACTERISTICS OF OLED
Systems analyze the followings
color coordinates of OLED
color index of OLED
Irradiance –wavelength  spectra of OLED
 color temperature of OLED. 
stability testing of OLED
Lifetime measurements of OLED


ELECTROLUMINANCE ANALYSIS

Electro luminance system analyze the wavelength of irradiated LED, temperature color, color index and quantum efficiency.
ExternalQuantum efficiency can be obtained by the following relation

EQE=R hc/λ
R is the photoresponse
 is the wavelength of irradiated LED

EQE is determined from Electroluminance spectra of LED via Eq.1.

The system contains the following elements: 
I-V source meter 
Spectrophotometer
Wavelength range: 380-780 nm, Visible region.
Voltage range: -20 V to +20 V 
Current range: 50 pA to 250 mA 
- OLED software 
- OLED probe holder 
- 1 Laptop or All in one computer 

OLED CHARACTERIZATION SYSTEM

  • Product Code: OLED-characterization-system-9000
  • Availability: In Stock
  • 0.00TL



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