× PHOTOSYNTHETICALLY ACTIVE RADIATION SYSTEM HYPERTHERMIA THERAPY SYSTEM PROBE STATION PROBE HOLDER HIGH TEMPERATURE FURNACE CURRENT-VOLTAGE TESTER UNDER VARIOUS TEMPERATURES PHOTODEVICE CHARACTERIZATION SYSTEM TRIBOMETER AAA CLASS LED SOLAR SIMULATOR 9830 EPD COATING SYSTEM PHOTORESPONSE SYSTEM SOLAR PANEL SOLAR SIMULATOR ELECTROSPINNING SYSTEM ESP 9300 AAA CLASS SOLAR SIMULATOR FYTRONIX-9860 XENON LIGHT SOURCE CYCLIC VOLTAMETRY ELECTRODES 9000-HOT PRESS 9000-HOT PRESS 2 PHOTOCONDUCTIVITY – TIME MEASUREMENT SYSTEM LED QUANTUM EFFICIENCY SYSTEM FY-MGSP-3 2 RF + 1 DC MAGNETRON SPUTTERING SYSTEM FYT-T1800 1800C HIGH TEMPERATURE TUBE FURNACE UV CURABLE EPD COATING SYSTEM ULTRASONIC SPRAY COATING SYSTEM ULTRASONIC SONICATOR SPARK PLASMA SYSTEM SOL GEL THIN FILM COATER SILAR QUANTUM DOTS COATER REFERENCE SOLAR CELL CERTIFICATE REFERECE SOLAR CELL QUANTUM EFFICIENCY SYSTEM PHOTORESPONSE AND PHOTOCAPACITANCE ANALYZER PHOTOCHEMICAL SYSTEM PHOTOCATALYSIS SYSTEM PHOTOCATALYSIS SOLAR SIMULATOR OPTICAL CONSTANTS CHARACTERIATION SYSTEM OLED CHARACTERIZATION SYSTEM OFET CHARACTERIZATION SYSTEM FULL AUTOMATIC SOLAR SIMULATOR MICROMETER ADJUSTABLE THIN FILM COATER DOCTOR BLADE MARKSTRONIC AAA CLASS LED SOLAR SIMULATOR MAGNETIC FIELD ASSISTED ELECTROSPINNING IMPEDANCE ANALYZER LCR METER IMPEDANCE ANALYZER HIGH PRESSURE REACTOR SYSTEM HALL EFFECT MEASUREMENT SYSTEM GLOVEBOX SYSTEM GAS SENSOR MEASUREMENT SYSTEM UV DEZENFEKTE CİHAZI SPIN COATER HYDROTHERMAL SYSTEM EPD COATING SYSTEM ELECTROSPINNING SYSTEM 9800 AAA CLASS SOLAR SIMULATOR 9600 AAA CLASS SOLAR SIMULATOR FULL AUTOMATIC SOLAR IV – IMPEDANCE ANALYZER SYSTEM FOUR PROBE CONDUCTIVITY METER FOUR POINT PROBE RESISTANCE SYSTEM ELEKTROSPINNING MACHINE ELECTROSPINNING MACHINE/NANOFIBER ELECTROPHORETIC DEPOSITION (EPD) ELECTRICAL CONDUCTIVITY SYSTEM DYE SENSITIZED SOLAR CELL HOLDER DIP COATER DIELECTRIC MEASUREMENT SYSTEM DIELECTRIC ANALYZER CURRENT AND VOLTAGE MODULATED SYSTEM CONTACT ANGLE TESTER CHEMOTHERAPY OF CANCER 9000 CHEMICAL BATH DEPOSITION CAPACITANCE-VOLTAGE ANALYZER BATTERY CHARGE - DISCHARGE ANALZYER AGATE MORTAR FOR GRINDING AAA CLASS SOLAR SIMULATOR IV CHARATERIZATION SYSTEM 9900 AAA CLASS LED SOLAR SIMULATOR 9800 300 W AAA CLASS SOLAR SIMULATOR 300 W-80 AAA CLASS SOLAR SIMULATOR 300 W-50 AAA CLASS SOLAR SIMULATOR ELEKTROSPINNING NANOFIBER SPIN COATERS - PHOTOLITHOGRAPHY SPIN COATER SOURCE MEASURE UNIT SYSTEM I-V MEASURE SOURCE METER IV AND CV ANALYZER SOLAR SIMULATOR- AAA CLASS SOLAR SIMULATOR SOLAR SIMULATOR AAA CLASS CRYOSTAT ULTRASONIC CLEANING BATH THIN FILM TRANSISTOR CHARACTERIZATION SYSTEM ULTRASONIC SONICATOR 2 HYDROTHERMAL REACTOR/HIGH PRESSURE REACTOR HIGH VOLTAGE POWER SUPPLY HYDROTHERMAL SYSTEM HIGH TEMPERATURE FURNACE FOUR POINT PROBE SCS SEMICONDUCTOR CHARACTERIZATION SYSTEM ELECTRICAL CONDUCTIVITY ANALYZER OPEN SYSTEM NITROGEN CRYOSTAT DC GÜÇ KAYNAĞI 12V/8A THERMAL EVAPORATION AND MAGNETRON SPUTTER SYSTEM WITH OPTIONAL GLOVEBOX INTEGRATION THERMAL ANALYSIS CRUCIBLE CERAMIC ITCH METTLER ALUMINA/TG/DIFFERENTIAL HEAT DSC TGA/DTA
  • QUANTUM EFFICIENCY SYSTEM

   QUANTUM EFFICIENCY SYSTEM



SOFTWAREs
QE characterization Software

FYTRONIX IPCE CHARACTERIZATION SYSTEM includes 

This system analyze quantum efficiency (EQE) characteristics of solar cells, 
Quantum efficiency (QE) – also referred to as Incident Photon to Charge Carrier Efficiency (IPCE) - indicates the ratio of the number of photons incident on a solar cell to the number of generated charge carriers.

The system contains the following elements: 
Quantum efficiency system 
Wavelength range: 380-1100 nm
USA Spectral monochromator 
Design: Double cascaded Czerny-Turner
Double grating turrets standard in each section
Focal Length: 110mm each section f/#
Beam Path: Straight through standard
Wavelength Drive: Dual worm and wheel with electronic synchronization and computer control.
Programmable in additive or subtractive dispersion with positive or negative gratings orders.
Wavelength Precision: 0.1nm (Additive) 0.2nm (Subtractive)
Wavelength Accuracy ± 0.3nm (Additive) ± 0.6nm (Subtractive)
Slewing Speed > 100nm/s
Stray Light <10-9
Slits Standard set includes: 0.125mm, 0.15mm, 0.3mm, 0.6mm, 1.2mm, and 2.4mm x 4.0mm.
Max Resolution < 0.5nm (Additive) < 1nm (Subtractive)
Band Pass: ~1nm (with 1200gv/mm grating and 0.15mm slit)
Gratings: 2 or 4 gratings 
Lock in amplifier for V-I  conversion


FYTRONIX FY-IPCE-9000 SYSTEM measures the followings 
Photocurrent-wavelength measurements 
External quantum efficiency measurements, EQE 

SPECIFICATIONS OF QUANTUM EFFICIENCY and IV SYSTEM
1. System should measure quantum efficiency of the solar cell
2. The wavelength of the system is  in the range of 380-1100 nm according to IEC and ASTM standards
3. The system measure current-wavelength measurements of solar cells
4. The monochromator should have the following technical data 
Design: Double cascaded Czerny-Turner
Focal Length: 110mm each section f/#
Beam Path: Straight through standard
Wavelength Drive: Dual worm and wheel with electronic synchronization and computer control.
Programmable in additive or subtractive dispersion with positive or negative gratings orders.
Wavelength Precision: 0.1nm (Additive) 0.2nm (Subtractive)
Wavelength Accuracy ± 0.3nm (Additive) ± 0.6nm (Subtractive)
Slewing Speed > 100nm/s
Stray Light <10-9
Slits Standard set includes: 0.125mm, 0.15mm, 0.3mm, 0.6mm, 1.2mm, and 2.4mm x 4.0mm.
Max Resolution < 0.5nm (Additive) < 1nm (Subtractive)
Band Pass: ~1nm (with 1200gv/mm grating and 0.15mm slit)
I/V converter for voltage and current conversion 
5. Photocurrent-wavelength measurements are performed at various voltages 
6. System have a solar light bias (solar simulator light)
7. System have a computer

QUANTUM EFFICIENCY SYSTEM

  • Product Code: QE-characterization-system-9000
  • Availability: In Stock
  • 0.00TL



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