SOFTWAREs
QE characterization Software
FYTRONIX IPCE CHARACTERIZATION SYSTEM includes
This system analyze quantum efficiency (EQE) characteristics of solar cells,
Quantum efficiency (QE) – also referred to as Incident Photon to Charge Carrier Efficiency (IPCE) - indicates the ratio of the number of photons incident on a solar cell to the number of generated charge carriers.
The system contains the following elements:
Quantum efficiency system
Wavelength range: 380-1100 nm
USA Spectral monochromator
Design: Double cascaded Czerny-Turner
Double grating turrets standard in each section
Focal Length: 110mm each section f/#
Beam Path: Straight through standard
Wavelength Drive: Dual worm and wheel with electronic synchronization and computer control.
Programmable in additive or subtractive dispersion with positive or negative gratings orders.
Wavelength Precision: 0.1nm (Additive) 0.2nm (Subtractive)
Wavelength Accuracy ± 0.3nm (Additive) ± 0.6nm (Subtractive)
Slewing Speed > 100nm/s
Stray Light <10-9
Slits Standard set includes: 0.125mm, 0.15mm, 0.3mm, 0.6mm, 1.2mm, and 2.4mm x 4.0mm.
Max Resolution < 0.5nm (Additive) < 1nm (Subtractive)
Band Pass: ~1nm (with 1200gv/mm grating and 0.15mm slit)
Gratings: 2 or 4 gratings
Lock in amplifier for V-I conversion
FYTRONIX FY-IPCE-9000 SYSTEM measures the followings
Photocurrent-wavelength measurements
External quantum efficiency measurements, EQE
SPECIFICATIONS OF QUANTUM EFFICIENCY and IV SYSTEM
1. System should measure quantum efficiency of the solar cell
2. The wavelength of the system is in the range of 380-1100 nm according to IEC and ASTM standards
3. The system measure current-wavelength measurements of solar cells
4. The monochromator should have the following technical data
Design: Double cascaded Czerny-Turner
Focal Length: 110mm each section f/#
Beam Path: Straight through standard
Wavelength Drive: Dual worm and wheel with electronic synchronization and computer control.
Programmable in additive or subtractive dispersion with positive or negative gratings orders.
Wavelength Precision: 0.1nm (Additive) 0.2nm (Subtractive)
Wavelength Accuracy ± 0.3nm (Additive) ± 0.6nm (Subtractive)
Slewing Speed > 100nm/s
Stray Light <10-9
Slits Standard set includes: 0.125mm, 0.15mm, 0.3mm, 0.6mm, 1.2mm, and 2.4mm x 4.0mm.
Max Resolution < 0.5nm (Additive) < 1nm (Subtractive)
Band Pass: ~1nm (with 1200gv/mm grating and 0.15mm slit)
I/V converter for voltage and current conversion
5. Photocurrent-wavelength measurements are performed at various voltages
6. System have a solar light bias (solar simulator light)
7. System have a computer
QUANTUM EFFICIENCY SYSTEM
- Product Code: QE-characterization-system-9000
- Availability: In Stock
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