PROBE STATION FYTRONIX THIN FILM TRANSISTOR CHARACTERIZATION SYSTEM
(FYTRONIX TFT-500)
FYTRONIX THIN FILM TRANSISTOR CHARACTERIZATION SYSTEM includes
This SYSTEM analyzes transfer and output characteristics of thin film transistors , TFT, OFET
The system is a complete THIN FILM TRANSISTOR CHARACTERIZATION system.
The system contains the following elements:
Sourcemeter
Probe station
Voltage range: -50 V to +50 V or any range
Computer control or manuel
FYTRONIX THIN FILM TRANSISTOR CHARACTERIZATION system performs the followings
Source-drain IV characteristics under various gate voltages
Gate Voltage-Current characteristics under various drain voltages
Phototransistors Source-drain IV characteristics under various gate voltages
PROBE STATION
- Product Code: Probe-station-9000
- Availability: In Stock
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0.00TL
