THIN FILM TRANSISTOR CHARACTERIZATION SYSTEM

The system is a complete THIN FILM TRANSISTOR CHARACTERIZATION  system.

Technical Datasheet

The system contains the following elements:

Sourcemeter

Probe station

Voltage range: -200 V to +200 V 

Current range: 10Pa-1A 

Software

PROBE STATION can be used for current-voltage characteristics of electronic devices such as solar cell, photodiode, sensor and thin film transıstors. Probe station is designed according to below technical properties

XYZ manipulators ( 2 or 3 )

Vacuum chuck 

Temperature chuck 

Temperature controller

Microscope for thin film transistor applications

High resolution camera: 5 MPA

Magnification: 130X 

Monitor 

Probe pin: Spring pin