WAVELENGTH PHOTODEVICE SYSTEM

Photodiode – Photosensor – Photodetector – Solar Cell Test Platform

SYSTEM OVERVIEW

The Current and Voltage Modulated Characterization System is a fully automated measurement platform designed to analyze:

• Photodiodes

• Photosensors

• Photodetectors

• Solar cells

The system performs current-voltage (I-V), photocurrent, and spectral response measurements under:

• Various solar light intensities

• Multiple discrete wavelengths

• Modulated voltage and pulse conditions

All measurements are computer-controlled and fully automated.

INCLUDED SOFTWARE PACKAGES

1️⃣ IMSP and VMSP Characterization Software

• Current-modulated characterization

• Voltage-modulated characterization

• Automated I–V scanning

2️⃣ Photocurrent Software

• Photocurrent (Iph) analysis

• Wavelength-dependent measurements

• Spectral response evaluation

3️⃣ Photo Transient-Time Software

• Time-resolved photoresponse

• Pulse-based transient measurements

PHOTOCONDUCTIVITY CHARACTERIZATION SYSTEM

This system analyzes modulated current and voltage characteristics of:

• Photodiodes

• Photosensors

• Photodetectors

• Solar cells

Under various wavelengths.

MEASUREMENT CAPABILITIES

I) Current–Voltage (I–V) Measurements Under Various Wavelengths

Wavelengths (nm):

370, 380, 390, 400, 410, 430, 450, 460, 520, 570, 610, 620, 690, 750, 760, 820, 860, 960, 980, 1010 (Upgradeable up to 30 wavelengths)

Performed Measurements:

• I–V characteristics of solar cells, photodiodes, photosensors

• Photocurrent–Voltage (Iph–V) characteristics

• Power–Voltage (P–V) characteristics

• ln(I)–Voltage characteristics

• Short circuit current (Isc) – Wavelength characteristics

II) Photo Transient Current–Time Measurements

Performed under various wavelengths:

• Photocurrent–Time measurements

• Photoresponse–Time measurements

• Photoresponsivity–Time measurements

• Photodetectivity–Time measurements

III) Photocurrent – Wavelength Measurements

Performed under various wavelengths:

• Photocurrent–Wavelength (Iph–λ)

• Photoresponse–Wavelength

• Photoresponsivity–Wavelength

• Photodetectivity–Wavelength

SYSTEM TECHNICAL SPECIFICATIONS

A) I–V Source Meter System

• Voltage Range: -7 V to +7 V

• Current Range: 10 nA to 30 mA

Included Software:

• I–V Software

• Photo Transient-Time Software

• Photocurrent-Wavelength Software

• Wavelength Range: 380 nm – 1050 nm

B) Electronic Pulse Generator

• Pulse Width Range: 200 microseconds to seconds

Suitable for high-speed transient photoresponse measurements.

C) LED-Based Monochromator

Standard Wavelengths (nm):

370, 380, 390, 400, 410, 430, 450, 460, 520, 570, 610, 620, 690, 750, 760, 820, 860, 960, 980, 1010

• Expandable up to 30 discrete wavelengths

• Stable and high-intensity LED sources

PHOTORESPONSE SYSTEM FEATURES

• Fully computer-controlled

• Automatic wavelength switching

• Automatic I–V scanning under selected wavelengths

• Automatic photocurrent–wavelength (Iph–λ) measurements

• Real-time data visualization

• Data export capability

APPLICATION AREAS

• Solar cell characterization

• Photodiode research

• Photosensor development

• Photodetector performance analysis

• Spectral response studies

• R&D laboratories

• University research centers

SYSTEM ADVANTAGES

✔ Fully automated operation

✔ Wide wavelength coverage (380–1050 nm)

✔ Transient and steady-state measurements

✔ Compact LED-based monochromator

✔ High measurement precision

✔ Modular and upgradeable design

CUSTOMIZATION

SYSTEM IS UPGRADED ACCORDING TO CUSTOMER REQUIREMENTS

• Additional wavelengths

• Extended voltage/current ranges

• Custom software modules

• Special device holders

COMPLETE CHARACTERIZATION PLATFORM

This system provides:

• Full Current–Voltage (I–V) analysis

• Photocurrent (Iph) measurements

• Spectral response analysis

• Transient photoresponse characterization

A complete turnkey solution for optoelectronic device characterization.