Multi-Wavelength Spectral Photoresponse & Photodevice Measurement System
- Product Code: WAVELENGTH-PHOTODEVICE-SYSTEM
- Availability: In Stock
WAVELENGTH PHOTODEVICE SYSTEM
SOLAR-METRIX ULTRA
Multi-Wavelength
Spectral Photoresponse & Photodevice Measurement System
Next-Generation Solution
for I-V, Iph-λ, and Phototransient Analysis
The SOLAR-METRIX ULTRA is a fully
integrated measurement platform designed to determine both the steady-state and time-dependent
(transient) optoelectronic properties of solar cells, photodiodes, and
photosensors.
1. Advanced
Measurement Modules & Software Infrastructure
The system comprises three core software and hardware
layers:
- I-V
Software Module: Fundamental electrical characterization.
- Photo-Transient
Software: Time-resolved characteristic analysis.
- Photocurrent-Wavelength
(Iph- l)
Software: Spectral sensitivity and responsivity analysis.
2. Spectral
Characterization & LED-Based Monochromator
Unlike conventional monochromators, the system
features a high-speed, high-precision LED-based monochromator unit.
- Wavelength
Range: 370 nm – 1010 nm (Expandable to various wavelengths upon
request).
- Standard
Wavelengths (nm): 370, 380, 390, 400,
410, 430, 450, 460, 520, 570, 610, 620, 690, 750, 760, 820, 860, 960, 980,
1010.
- Electronic
Pulse Generator: Capability to generate precise light pulses ranging from 200
microsecondsto seconds.
3. Automated
Measurement & Analysis Capabilities
A. I-V and Power
Characteristics
Automatic mapping of electrical performance under
various wavelengths:
- I-V & Photo-I-V: Dark
and illuminated current-voltage curves.
- P-V
(Power-Voltage): Calculation of Maximum Power Point (Pmax), Fill
Factor (FF), efficiency, and other photovoltaic parameters.
- ln I - V: Analysis
of diode ideality and saturation parameters.
- Isc -
Intensity: Variation of short-circuit current with light intensity.
B. Phototransient
(Time-Dependent) Measurements
Speed and response analysis based on light Switch On/Off
states:
- Photocurrent-Time
(Iph-t): Current response
across different wavelengths.
- Photoresponse-Time: Rise
and fall time (trise / tdecay) analysis.
- Photodetectivity
& Photoresponsivity-Time: Temporal stability of
sensor performance.
C. Spectral
Photoresponse Analysis
- Iph} - l: Wavelength-dependent photocurrent measurements.
- Photodetectivity
(D) & Photoresponsivity (R): Wavelength-specific
detector performance figures of merit.
4. Hardware &
System Specifications
|
Parameter |
Technical
Specification |
|
Source Meter
Voltage Range |
-7 V to +7 V |
|
Source Meter
Current Range |
10 nA to 30
mA |
|
Wavelength
Control |
380 nm - 1050
nm (Fully Automated) |
|
Pulse Width |
100 ms - 5000
ms |
|
Control
System |
Computer
Controlled (RS232 / USB Interface) |
|
Scalability |
Upgradable
architecture based on customer requirements |
5. System Components
& Standards
- High-Precision
Source Meter (I-V Unit).
- Integrated
Sample Holder & LED Driver Unit.
- Data
Analysis Station: 19" All-in-One
Computer.
- Certification: ISO
9001:2015 (Certified for Scientific Instrument Manufacturing) and
Industrial Registry Certificate.
6. Why SOLAR-METRIX
ULTRA?
The system is far more than a standard I-V meter; it
is an all-in-one research station providing a vast range of
data—from the response speed of photodiodes to the spectral analysis associated
with the quantum efficiency of solar cells. The system is highly customizable,
allowing for an increased number of channels or wavelengths to meet specific
research needs.
